Imaging Science and Photochemistry ›› 2016, Vol. 34 ›› Issue (1): 5-14.DOI: 10.7517/j.issn.1674-0475.2016.01.005

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Advances in Measurement of Optical Central Thickness by Low Coherence Interferometry

TAN Zehao1,2, FENG Yunpeng1,2, WANG Zhong3   

  1. 1. Joint Research Center for Optomechatronics Engineering, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, P. R. China;
    2. Shenzhen Research Institute, Beijing Institute of Technology, Shenzhen 518057, Guangdong, P. R. China;
    3. Boruihuida Science and Technology Ltd. Co., Shenzhen 518057, Guangdong, P. R. China
  • Received:2015-10-23 Revised:2015-11-10 Online:2016-01-15 Published:2016-01-15

Abstract:

With the advantages of high accuracy and fast speed,low coherence interferometry has broad prospects on non-contact measurement of optical system and biomedical imaging. By overviewing the important advances in simultaneous measurement of central thickness in lens system and describing the research status on biomedical imaging with OCT,we compare multiple research methods of low coherence interferometry by analyzing their innovation and finally prospect its development trend on new fields and improvements.

Key words: non-contact measurement, low coherence interferometry, OCT, lens thickness, biomedical imaging