[1] Youngquist R C,Carr S,Davies D E N. Optical coherence-domain reflectometry-a new optical evaluation technique[J]. Optics Letters,1987,12(3):158-160.
[2] Fercher A F,Mengedoht K,Werner W. Eye-length measurement by interferometry with partially coherent light[J]. Optics Letters,1988,13(3):186-188.
[3] Fujimoto J G,Desilvestri S,Ippen E P,Puliafito C A,Margolis R,Oseroff A. Femtosecond optical ranging in biological-systems[J]. Optics Letters,1986,11(3):150-150.
[4] Huang D,Swanson E A,Lin C P,Schuman J S,Stinson W G,Chang W,Hee M R,Flotte T,Gregory K,Puliafito C A,Fujimoto J G. Optical coherence tomography[J]. Science,1991,254(5053): 1178-1181.
[5] 苑立波. 光纤白光干涉技术的回顾与展望[J]. 光学学报,2011,31(9):314-326.Yuan L B. Overview and forecast of fiber optic white-light interfreometry[J]. Acta Optica Sinica,2011,31(9):314-326.
[6] Haruna M,Ohmi M,Mitsuyama T,Tajiri H,Maruyama H,Hashimoto M. Simultaneous measurement of the phase and group indices and the thickness of transparent plates by low-coherence interferometry[J]. Optics Letters, 1998,23(12):966-968.
[7] Ohmi M,Shiraishi T,Tajiri H,Haruna M. Simultaneous measurement of refractive index and thickness of transparent plates by low coherence interferometry[J]. Optical Review, 1997,4:507-515.
[8] Maruyama H,Mitsuyama T,Ohmi M,Haruna M. Simultaneous measurement of refractive index and thickness by low coherence interferometry considering chromatic dispersion of index[J]. Optical Review,2000,7(5): 468-472.
[9] Maruyama H,Inoue S,Mitsuyama T,Ohmi M,Haruna M. Low-coherence interferometer system for the simultaneous measurement of refractive index and thickness[J]. Applied Optics,2002,41(7): 1315-1322.
[10] Choi E S,Na J,Lee B H. Fiber-based high-resolution OCT system with halogen light source[J]. Proceedings of SPIE,2004,454-462.
[11] Kim S,Na J,Kim M J,Lee B H. Simultaneous measurement of refractive index and thickness by combining low-coherence interferometry and confocal optics[J]. Optics Express,2008,16(8): 5516-5526.
[12] Wilhelm R,Courteville A,Garcia F. Dimensional metrology for the fabrication of imaging optics using a high accuracy low coherence interferometer[C]. Proceedings of the Conference on Optical Measurement Systems for Industrial Inspection IV. Germany:Munich,2005,469-480.
[13] Courteville A,Wilhelm R,Garcia F. A novel low coherence fibre optic interferometer for position and thickness mea-surements with unattained accuracy[C]. Proceedings of the Conference on Speckles, From Grains to Flowers. France: Nimes,2006,63411Q-1-63411Q-6.
[14] Wilhelm R,Courteville A,Garcia F,De Vecchi F. On-axis non-contact measurement of glass thicknesses and airgaps in optical systems with submicron accuracy-art. No. 66163p[C]. Proceedings of the Conference on Optical Measurement Systems for Industrial Inspection V. GERMANY:Munich,2007.
[15] Langehanenberg P,Dumitrescu E,Heinisch J,Krey S,Ruprecht A K. Automated measurement of centering errors and relative surface distances for the optimized assembly of micro optics[C].Proceedings of the Conference on Micromachining and Microfabrication Process Technology XVI. San Francisco:CA,2011,7926(1):225-229.
[16] Langehanenberg P,Ruprecht A,Off D,Lueerss B. Highly accurate measurement of lens surface distances within optical assemblies for quality testing[C]. Optical System Alignment, Tolerancing, and Verification VII. 2013,88440F-1-88440F-8.
[17] Stickler D,Langehanenberg P,Luerss B,Heinisch J. Optomechanical characterization of large wafer stepper-optics with respect to centering errors,lens distances,and center thicknesses[C]. Proceedings of the Conference on Optical Microlithography XXVI. San Jose:CA,2013,86832C-1-86832C-8.
[18] Lueerss B,Langehanenberg P. Thickness and air gap mea-surement of assembled IR objectives[C]. Proceedings of the Conference on Dimensional Optical Metrology and Inspection for Practical Applications IV. Baltimore:MD,2015, 96480D1-96480D10.
[19] 王志斌,史国华,何益,丁志华,张雨东. 光学相干层析技术在光学表面间距测量中的应用[J]. 光学精密工程,2012,20(7):1469-1474. Wang Z B,Shi G H,He Y,Ding Z H,Zhang Y D. Application of optical coherence tomography to distance measurement of optical surface[J]. Optics and Precision Engineering,2012,20(7): 1469-1474.
[20] Watanabe K,Nomura T,Ieee. Refractive index & physical thickness distributions measurement and consideration of dependence of measurement accuracy on scanning interval using low-coherence digital holography[C].2013 IEEE/Sice International Symposium on System Integration (Sii),2013,586-591.
[21] Watanabe K,Ohshima M,Nomura T. Simultaneous measurement of refractive index and thickness distributions using low-coherence digital holography and vertical scanning[J]. Journal of Optics,2014,16(4):2218-2221.
[22] Zilio S C. Simultaneous thickness and group index mea-surement with a single arm low-coherence interferometer[J]. Optics Express,2014,22(22):27392-27397.
[23] Marcus M A,Hadcock K J,Gibson D S,Herbrand M E,Ignatovich F V. Precision interferometric measurements of refractive index of polymers in air and liquid[J]. Proceedings of SPIE,2013,8884:255-267.
[24] Verrier I,Veillas C,Lepine T. Low coherence interferometry for central thickness measurement of rigid and soft contact lenses[J]. Optics Express,2009,17(11):9157-9170.
[25] Lauri J,Czajkowski J,Myllyla R,Fabritius T. Measuring flow dynamics in a microfluidic chip using optical coherence tomography with 1μm axial resolution[J]. Flow Mea-surement and Instrumentation,2015,43(3):1-5. |