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Imaging Science and Photochemistry  2016, Vol. 34 Issue (1): 5-14    DOI: 10.7517/j.issn.1674-0475.2016.01.005
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Advances in Measurement of Optical Central Thickness by Low Coherence Interferometry
TAN Zehao1,2, FENG Yunpeng1,2, WANG Zhong3
1. Joint Research Center for Optomechatronics Engineering, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, P. R. China;
2. Shenzhen Research Institute, Beijing Institute of Technology, Shenzhen 518057, Guangdong, P. R. China;
3. Boruihuida Science and Technology Ltd. Co., Shenzhen 518057, Guangdong, P. R. China

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