[1] Tenne, R., Hodes G., Appl. Phys. Lett., 1980, 37, 428.
[2] Hodes, G., Nature 1980, 285, 29.
[3] Russak, A. M., Creter C., J. Electrochem. Soc., 1984, 131, 556.
[4] Levy-Clement C., Triboulet R., Rioux J., Etcheberry A., Licht S., Tenne R., J. Appl. Phys., 1985, 58, 4703.
[5] Tenne R., Levy-Clement C., Sawatzky G., J. Vac. Sci. Technol., 1986, A4(6), 2470.
[6] De Silva K. T. L., Haneman D., Thin Solid Films, 1981, 78, 169.
[7] Noufi N. R., Kohl A. P., Rogers W. J., Jr., White M. J., Bard J. A., J. Electrochem. Soc., 1979, 126, 949." "
[8] Tenne, R., J. Electrochem. Soc., 1983, 130, 2163.
[9] Frese K. W., Jr., J. Electrochem. Soc., 1983, 130, 28.
[10] 李学萍、肖绪瑞、朱延宁,感光科学与光化学.1987,(2),11.
[11] Frese K. W., Jr., J. Appl. Phys., 1982, 53,1571.
[12] Marcu V., Tenne R., Rubinstein I., J. Electrochem. Soc., 1986, 133, 1143.
[13] Xiao X. R., Tien H. T., J. Electrochem. Soc., 1983, 130, 55.
[14] 肖绪瑞、张志伟、朱延宁,感光科学与光化学.(待发表)
[15] Hilazzo, G., Caroli S., Tables of Standard Electrode Potentials. Editor, John Wiley & Sons. New York, 1978.
[16] Briggs, D., Seah M. P., Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, Editor, John Wiley & Sons, New York, 1983.
[17] Berthou H., Jφrgensen K. C., Analytical Chemistry, 1976, 47, 482.
[18] Licht S., Tenne R., Flaisher H., Manassen J., J. Electrochem. Soc., 1984, 131, 950. |