Imaging Science and Photochemistry ›› 2006, Vol. 24 ›› Issue (6): 415-420.DOI: 10.7517/j.issn.1674-0475.2006.06.415

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Analysis of Laser Assisted Chemical Etching Properties of YBCO Film by Infrared Real Time Monitoring

LIU Juan-xiu, YANG Kai, BU Shi-rong, ZHANG Tian-liang, NING Jun-song, LUO Zheng-xiang   

  1. Microwave Center, University of Electronic Science and Technology of China, Chengdu 610054, Sichuan, P.R. China
  • Received:2006-06-10 Revised:2006-08-14 Online:2006-11-23 Published:2006-11-23

Abstract: An infrared real time monitoring system was designed to obtain thermal images of H3PO4 layer profile during laser assisted chemical etching of high temperature superconducting film (YBa2Cu3O7-δ film). The temperature distribution and heat diffuse of solution were studied, as well as the relation between infrared monitoring data and YBa2Cu3O7-δ laser assisted chemical etching characteristics was analyzed. The major experimental conclusions include: The temperature distribution and heat diffuse of solution can be truly reflected by infrared thermal image, which is valuable for the analysis of thermal circumstance of laser assisted etching; the created heat diffuse height on YBa2Cu3O7-δ film surface and corresponding infrared grey-scale can be achieved at any time to analyze the differences between etching starting duration and etching degree of any small regions on YBa2Cu3O7-δ film surface, which provides a new method for the real time monitoring of laser assisted etching properties of YBa2Cu3O7-δ and other materials.

Key words: laser assisted chemical etching, infrared technique, high temperature superconductor, YBa2Cu3O7-δ

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