MEASURING THE THICKNESS OF TABULAR SILVER HALIDE CRYSTALS WITH SCANNING ELECTRONIC MICROSCOPE

doi:10.7517/j.issn.1674-0475.1993.01.1

Imaging Science and Photochemistry ›› 1993, Vol. 11 ›› Issue (1): 1-4.DOI: 10.7517/j.issn.1674-0475.1993.01.1

MEASURING THE THICKNESS OF TABULAR SILVER HALIDE CRYSTALS WITH SCANNING ELECTRONIC MICROSCOPE

LIU SU-WEN, YUE JUN, YAN TJAN-TANG

Department of Modern Chemistry Vnitersity of Science & Technology of China, Hefei 230026, P. R. China

Received:1991-10-04 Revised:1992-09-29 Online:1993-02-20 Published:1993-02-20

Abstract

Abstract: A Simple method for measuring the thickness of tabular silver halide grains with scanning electronic microscope is reported in the present paper. The preparation of the specimen and the application of inclination effect of scanning electronic microscope for measuring the thickness of T-grain are also discussed.

Key words: tabular grain, aspect ratio, scanning electronic microscope, inclination effect, thickness

LIU SU-WEN, YUE JUN, YAN TJAN-TANG. MEASURING THE THICKNESS OF TABULAR SILVER HALIDE CRYSTALS WITH SCANNING ELECTRONIC MICROSCOPE[J]. Imaging Science and Photochemistry, 1993, 11(1): 1-4.

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MEASURING THE THICKNESS OF TABULAR SILVER HALIDE CRYSTALS WITH SCANNING ELECTRONIC MICROSCOPE

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