Imaging Science and Photochemistry ›› 2003, Vol. 21 ›› Issue (5): 334-337.DOI: 10.7517/j.issn.1674-0475.2003.05.334

Previous Articles     Next Articles

THE MORPHOLOGY OF THE T-GRAIN OBSERVED BY AFM

CAO Li-zhi, WANG Han, JIAO Jia-jun, ZHUANG Si-yong   

  1. Institute of Fine Chemicals, East China University of Science and Technology, Shanghai 200237, P. R. China
  • Received:2003-05-19 Revised:2003-05-29 Online:2003-09-23 Published:2003-09-23

Abstract: The morphology of the T-grain was observed by a AFM.The size and the thickness of a crystal,and the fine morphology of the surface of the T-grain was obtained.The results showed that the surface contained a number of protrusions,which grew after a long time exposure indicating that the photolytic silver clusters,or the latent images,were formed preferentially at active positions on the surface of the grain.

Key words: AFM, photographic emulsion, T-grain, morphology

CLC Number: