Imaging Science and Photochemistry ›› 2004, Vol. 22 ›› Issue (3): 202-210.DOI: 10.7517/j.issn.1674-0475.2004.03.202

Previous Articles     Next Articles

Application of Microwave Phase-Sensitive Technique in the Study of Photoelectron Action in the Sulfur-Sensitized T-Grains AgBrI Emulsion

LU Xiao-dong1,2, LI Xiao-wei2   

  1. 1. Physics Department, Jaying University, Meizhou 514015, Guangdong, P. R. China;
    2. College of Physics Science and Technology, Hebei University, Baoding 071002, Hebei, P. R. China
  • Received:2003-11-17 Revised:2004-02-04 Online:2004-05-23 Published:2004-05-23

Abstract: By microwave phase-sensitive technique, the instantaneous decay signals of free electrons and trapped electrons in AgBrI, which was sulfurized, were obtained.The relationships between sulfurizing time and the decay time of photoelectrons, the effects of electron traps, the lifetime of photoelectrons, the effective depth of traps and the transfer time of trapped electrons, were analyzed.From the experiment results, we got the best values of sulfurizing time, photoelectron decay time, effect of traps, lifetime of photoelectron, effective depth of traps and transfer time of trapped electrons.

Key words: microwave phase-sensitive, free carrier, trapped carrier, lifetime

CLC Number: